文章名稱引用次數(shù)

• Hybrid Particle Swarm Optimization Combined With Genetic Operators for Flexible Job-Shop Scheduling Under Uncertain Processing Time for Semiconductor Manufacturing23
• A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing15
• A Data Driven Cycle Time Prediction With Feature Selection in a Semiconductor Wafer Fabrication System12
• Anomaly Detection and Segmentation for Wafer Defect Patterns Using Deep Convolutional Encoder-Decoder Neural Network Architectures in Semiconductor Manufacturing10
• Fault Detection and Diagnosis Using Self-Attentive Convolutional Neural Networks for Variable-Length Sensor Data in Semiconductor Manufacturing8
• Compact Analytical Model to Extract Write Static Noise Margin (WSNM) for SRAM Cell at 45-nm and 65-nm Nodes7
• Just-In-Time Modeling With Variable Shrinkage Based on Gaussian Processes for Semiconductor Manufacturing6
• Efficient Approach to Cyclic Scheduling of Single-Arm Cluster Tools With Chamber Cleaning Operations and Wafer Residency Time Constraint4
• Scheduling of Dual Resource Constrained Lithography Production: Using CP and MIP/CP4
• Photoelectrochemical Etching Technology for Gallium Nitride Power and RF Devices3